Showing posts with label IMDvista. Show all posts
Showing posts with label IMDvista. Show all posts

Wednesday, April 11, 2018

LUNA Blog-TeraMetrix™ multilayer thickness measurement featured at NP®



http://lunainc.com/terametrix-multilayer-thickness-measurement-featured-np/

While our last post was about our participation in a very focused event concentrating on thin wall packaging, we are now announcing that we will be participating in one of the major plastic industry events.
NPE® is a “must-attend” event for a wide array of people from across the plastics supply chain and the end user market.  Held every other year in Orlando, NPE is produced by the Plastics Industry Association, and draws an average attendance of 65,000, and over 2,000 exhibiting companies.


While we do not have a booth of our own, TeraMetrix (a division of Luna) is proud to announce that their multilayer thickness measurement solution will be presented and/or demonstrated in a number of exhibit booths.  Whether it is a demonstration of online barrier layer measurement at IMDvista (booth S11057), or presentation of an integrated web process control solution at Thermo Fisher Scientific (booth S28161) or Indev-ACT (booth S15131), or measurement of extruded pipe thickness at iNOEX (booth W3191), TeraMetrix T-Gauge® sensors are being used to improve product quality and reduce waste.
The T-Gauge sensor is optimized for the production environment, with a robust, lightweight sensor head suitable for scanning.  The gauge carries UL, CE and FCC certifications, and a Class I Division 1 certified sensor is available for explosive environments.  Its high-speed measurement rate (up to 1000 Hz) and high precision provide unsurpassed performance in online applications.


While a demonstration of our T-Gauge capability is always impressive, it is more important to provide a complete solution that can be easily integrated into a manufacturing process.  In conjunction with our partners, we are able to supply just such a solution.
Margaret Murdock (General Manager), as well as John Riccardi (Global Sales), Steve Williamson (Director of Engineering) and Irl Duling (Business Development) will be available during the show to support our integrators, and to develop relationships with new customers. 
John Riccardi comments on NPE, “Eight years ago TeraMetrix introduced the first industrial terahertz platform for real time plant floor deployment.  Since then our channel partners have deployed dozens of T-Gauge systems covering a wide range of plastics applications.   Now TeraMetrix offers disruptive solutions that perform multi-layer measurements previously resolved only with complex arrays of nucleonic or other more costly inefficient technology.” 
We invite you to visit our partners at NPE or contact us directly at terahertzsales@lunainc.com.

Wednesday, April 4, 2018

Focus on: IMDvista-terahertz thin wall packaging


https://www.imdvista.ch/en/products/barrier-testing.php#top

Introducing IMDvista LAYER, a new nondestructive multilayer thickness measurement solution for multi-layer plastic bottles, containers, preforms and thin wall packaging.
LAYER uses terahertz technology to inspect and measure individual layer thicknesses (greater than 10µm with differing refractive indices) in both opaque and translucent plastics in a matter of seconds, nondestructively, with a click of a button.
This off-line system demonstrates both speed and precision to provide measurements for up to 10 layers ranging in thickness from 10µm to 5 mm.
LAYER is an automated quality control system with a repeatable precision accuracy that eliminates human errors resulting from manual cutting of products in manufacturing quality control.
LAYER can measure the thickness of different layers, including the costly, ultra-thin barrier layer with an accuracy of better than +-5µm


Monday, March 19, 2018

LUNA Blog-Come see our multilayer online demonstration at Thin Wall Packaging




http://lunainc.com/multilayer-online-demonstration-thin-wall-packaging/

The T-Ray® 5000 T-Gauge® can measure all layers to micron precision, and can measure a buried layer to less than 25 microns.
This application is particularly useful in blow-molded products (bottles, cups, preforms, etc.).  The blow molding industry is large, and technologies that can measure buried layers, even on opaque products, have not existed until now.
With the high acquisition speed of the T-Ray 5000, this capability can be deployed online, measuring the cups or bottles as they pass. 
TeraMetrix™ will be at Thin Wall Packaging 2018 at the Westin Chicago North Shore on 20 and 21 March. 
We will be showing a live demonstration of online multilayer thickness measurement integrated with the IMD BTIR OEM online barrier imaging system, from IMDvista, and a daylight camera to provide unparalleled information about the internal barrier layer.



We are pleased to be recognized by IMDvista, a leader in online process control for the blow molding industry.  The integration of our product provides quantitative evaluation of the images provided by the BTIR OEM camera. 
Don’t miss out on this exciting new technology, come and see us in Chicago.