Join Luna for a FREE WEBINAR on improving optical component and system design, performance and quality
High-resolution optical backscatter reflectometry (OBR) has become a valuable tool in the design, test and diagnostics of fiber components, photonic integrated circuits (PICs) and short fiber networks. In much the same way standard OTDR is used for system-level test, high-resolution OBR can locate and identify issues (bends, breaks, bad splices, defects, interfaces, etc.) in components and short networks with sub-millimeter resolution long before they become problems.
Luna will be hosting a webinar, “See What You’re Missing: Improve Optical Component, PIC & Short Network Design Using High Resolution Backscatter Reflectometry,” that will review multiple applications of high-resolution OBR and demonstrate how OBR can help improve product quality and reduce cost and time to market. Examples will range from assessing the performance and quality of silicon photonics designs to trouble-shooting short fiber networks like those found in data centers and avionics applications.
We invite you to join us on March 8th at 9 a.m. or 12 p.m. EST (GMT-5:00) for this free event, hosted by Dr. Brian Soller, VP and GM, Lightwave Division of Luna.
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