Tyler L. Cocker; Max Eisele; Markus A. Huber; Markus Plankl; Leonardo Viti; Daniele Ercolani; Lucia Sorba; Miriam S. Vitiello; Rupert Huber
http://spie.org/Publications/Proceedings/Paper/10.1117/12.2188562
Terahertz spectroscopy plays a key role in understanding ultrafast carrier dynamics in nanomaterials. Diffraction, however, limits time-resolved terahertz spectroscopy to ensemble measurements. By combining time-resolved terahertz spectroscopy in the multi-terahertz range with scattering-type near-field scanning optical microscopy, we show that we can directly trace ultrafast local carrier dynamics in single nanoparticles with sub-cycle temporal resolution (10 fs). Our microscope provides both 10 nm lateral resolution and tomographic sensitivity, allowing us to observe the ultrafast build-up of a local surface depletion layer in an InAs nanowire.
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