Article first published online: 18 MAR 2015
DOI: 10.1002/adma.201500599
© 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
The response of individual domains in wafer-sized chemical vapor deposition graphene is measured by contactless sub-terahertz interferometry, observing the intrinsic optical conductance and reaching very high mobility values. It is shown that charged scatterers limit the mobility, validating previous theoretical predictions, and sub-terahertz quality assessment is demonstrated, as necessary for large-scale applications in touchscreens and wearable and optoelectronic devices.
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