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Pages- Terahertz Imaging & Detection
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Tuesday, January 26, 2016
Advantest Corp.- announces a time-domain reflectometry option for its TS9000 series of terahertz analysis systems
TOKYO — Advantest Corp. has announced a time-domain reflectometry option for its TS9000 series of terahertz analysis systems, enabling the analysis of circuit quality in semiconductors, printed substrates and electronic components.
The devices use time-domain reflectometry (TDR) and time-domain transmissometry (TDT) measurement technology to pinpoint and map circuit defects using short-pulse signal processing. The solution delivers circuit analysis with high spatial precision of <5 μm, and a maximum measurement range of 300 mm in TDR configuration or 600 mm in TDT configuration, including for internal circuitry used in through-silicon vias and interposers.
The optional data link locates, maps and displays errors on the CAD data of the target device.
Advantest Corp. has announced a time-domain reflectometry option for its TS9000 series of terahertz analysis systems, enabling the analysis of circuit quality in semiconductors, printed substrates and electronic components.
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