Abstract-Experimental Estimate of the Nonlinear Refractive Index of Crystalline ZnSe in the Terahertz Spectral Range

A. N. Tcypkin, S. E. Putilin, M. C. Kulya, M. V. Melnik, A. A. Drozdov, V. G. Bespalov, X.-C. Zhang, R. W. Boyd, S. A. Kozlov

https://link.springer.com/article/10.3103%2FS1062873818120237


A modification of the Z-scan technique for measuring nonlinear refractive index n2 in the terahertz spectral region is proposed. Measurements are made at a broadband terahertz radiation intensity of 0.8 × 109 W cm−2. Coefficient n2 = 2.5 × 10−11 cm2 W−1 is estimated for semiconductor crystalline ZnSe.