Abstract-Bias Dependence of Laser Terahertz Emission Nanoscopy

Angela Pizzuto, Pernille Klarskov, and Daniel M. Mittleman

http://www.etoponline.org/abstract.cfm?uri=CLEO_SI-2018-JM1A.3

We demonstrate depletion of terahertz emission from semiconductors by applying a DC bias between a substrate and an AFM probe operating in tapping mode. The depletion is strongly dependent on the probe tapping amplitude.

© 2018 The Author(s)