Abstract-Ultrafast Terahertz Scanning Tunneling Microscopy with Atomic Resolution

Vedran Jelic, Krzysztof Iwaszczuk, Peter Nguyen, Christopher Rathje, Graham Hornig, Haille Sharum, James Hoffman, Mark Freeman, and Frank Hegmann

https://www.osapublishing.org/abstract.cfm?uri=FiO-2016-FF3F.2

We demonstrate that THz-STM can probe single atoms on a silicon surface with simultaneous sub-nm and sub-ps resolution. THz-STM is established as a new technique for exploring high-field nonequilibrium tunneling phenomena with single atom precision.

© 2016 OSA

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