US PATENT-MEASURING DEVICE FOR RELECTION MEASUREMENTS OF TEST OBJECTS AND METHOD FOR MEASURING RADIATION REFLECTED BY TEST OBJECTS

Hochrein, Thomas (Wurzburg, DE) 

United States Patent Application 20160238375

Assignee:INOEX GmbH (Melle, DE) 

http://www.freepatentsonline.com/y2016/0238375.html

A measuring device for reflection measurements of test objects includes a transmitter for emitting radiation, a first collimation element for aligning the emitted radiation, a first focusing element for focusing emitted radiation in relation to the test object, and a receiver for detecting radiation reflected by the test object. There is a second collimation element for aligning the reflected radiation, and a second focusing element for focusing the reflected radiation in relation to the receiver. At least two of the first and second collimation elements and first and second focusing elements are separate from each other. Thus, a simple and flexible design of the measuring device is achieved, which can be adapted to the test object