Abstract & Article-Continuous-wave terahertz system based on a dual-mode laser for real-time non-contact measurement of thickness and conductivity

Kiwon Moon, Namje Kim, Jun-Hwan Shin, Young-Jong Yoon, Sang-Pil Han, and Kyung Hyun Park  »View Author Affiliations
http://www.opticsinfobase.org/oe/fulltext.cfm?uri=oe-22-3-2259&id=277890

Terahertz (THz) waves have been exploited for the non-contact measurements of thickness and refractive index, which has enormous industrial applicability. In this work, we demonstrate a 1.3-μm dual-mode laser (DML)-based continuous-wave THz system for the real-time measurement of a commercial indium-tin-oxide (ITO)-coated glass. The system is compact, cost-effective, and capable of performing broadband measurement within a second at the setting resolution of 1 GHz. The thickness of the glass and the sheet conductivity of the ITO film were successfully measured, and the measurements agree well with those of broadband pulse-based time domain spectroscopy and Hall measurement results.

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