Pages- Terahertz Imaging & Detection

Tuesday, July 31, 2012

Virginia Diodes Dr. Jeffry Hesler presents webinar


Launch
Date / Time
GMT Standard Time
Thu, Aug 23, 2012 06:00 PM
Eastern Daylight Time
Thu, Aug 23, 2012 02:00 PM
Pacific Daylight Time
Thu, Aug 23, 2012 11:00 AM


Agilent TechnologiesElectro Rent
Duration:60 minutes
Overview:
Development work on very high frequency devices and metamaterials has been limited by the difficulty in making good tests. Developers and users of amplifiers, mixers, filters, detectors, receivers, radios and metamaterials at these frequencies need tools for making critical measurements at mmwave and higher frequencies. This webinar show how instruments you are familiar with including Vector Network Analyzers, Signal Analyzers and Sources can be extended in frequency to make a variety of precision measurements at Gigahertz to Terahertz frequencies.
What attendees will learn:
  • Key applications using mmwave to Terahertz frequencies
  • Challenges in making measurements at very high frequencies
  • Measurement capabilities available
  • Test setups for component and metamaterial measurements


Presenter:
Dr. Jeffrey L. Hesler, Chief Technology Officer, Virginia Diodes, Inc.
Dr. Jeffrey L. Hesler received the B.S.E.E. in 1989 from Virginia Tech and the Ph.D. in 1996 from the University of Virginia. He is member of the Board of Directors and shareholder of Virginia Diodes, Inc. and serves as Chief Technology Officer of the corporation. In addition, he is affiliated with the University of Virginia as a Visiting Research Assistant Professor in the Department of Electrical and Computer Engineering. 

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