Friday, November 20, 2015

New THz-frequency contact probing for cryogenic applications from Lake Shore


https://elliotscientific.wordpress.com/2015/11/03/new-thz-frequency-contact-probing-for-cryogenic-applications-from-lake-shore/

Lake Shore have released details of their new THz-frequency contact probes. Compatible with Lake Shore’s CPX, CPX-VF, CRX-4K, and CRX-VF cryogenic probe station systems, the THz arm offers:
  • Precise on-wafer contact THz probing of millimetre wave devicesTHzProbeArm_4
  • New measurement possibilities for next-generation electronics
  • THz probes can be combined with standard DC/RF/microwave probe arms
  • Features a low-loss THz waveguide
  • Supports vector network analysers (VNAs) with suitable frequency extenders
  • Enables calibrated S-parameter and other hf electrical measurements at cryogenic temperatures and in magnetic fields
Signal deterioration at frequencies above 75 GHz has limited high-frequency contact measurement of electronic devices at room temperature, let alone cryogenic ones. Now Lake Shore’s breakthrough technology of a specially developed low-loss THz-frequency waveguide delivers excellent signal integrity over longer distances, at lower temperatures, and with superior arm mobility. All without interefering with the other probes in the system.

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